Darmis, Naimah, AHM Zahirul Alam, and Muhaimin Mohd Hashim. “Ferroelectric Behavior and NCFETs - TCAD Simulation”. Asian Journal of Electrical and Electronic Engineering 1, no. 1 (March 31, 2021): 30–41. Accessed March 29, 2024. https://journals.alambiblio.com/ojs/index.php/ajoeee/article/view/14.